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ATE(Test Handler)

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Memory Test Handler

M500HT
M500HT Series 이미지
  • Maximized Productivity with 512 Parallelism
  • Accurate temperature test possbile through
    temperature control accuracy of ±1.0℃
  • Optimized Handler solution for Memory Test proces
spec버튼 movie버튼
M500HT
spec
Item Specification
Docking Type (Vertical Docking Test Handler)
Parallel ( Single Test head) 512
UPH 40,960 (1Bin)
Jam Rate 1/25,000
Temp Control Range -40℃ ~ +125℃
min. device ball pitch >0.35mm
ball edge to package edge clearance >0.3mm
Min & Max Package size 6x6 ~ 12x12mm (Square)
Up to 12x20mm (Rectangular)
Min/Max Package Thickness ( include balls) 0.8-1.8mm
Target Package TSOP, TQFP, BGA, MCP, POP
CSP(μBGA, fBGA, QFN), etc.
취소버튼
MH7
MH7 이미지
  • Maximized Productivity with 768 Parallelism for the Nand Flash
  • Auto Teaching using vision installed in P&P Heads
  • Higher utilization rate by reducing temperature stablization time
spec버튼 movie버튼
취소버튼
MH7
ate_MH7
spec
Item Specification
Docking Type Vertical Docking Test Handler
Parallel ( Single Test head) 768
UPH 36,800 (1Bin)
Jam Rate 1/30,000
Temp Control Range -40℃ ~ +125℃
min. device ball pitch >0.35mm
ball edge to package edge clearance >0.3mm
Min & Max Package size 6x6 ~ 12x12mm (Square)
Up to 12x20mm (Rectangular)
Min/Max Package Thickness ( include balls) 0.8-1.8mm
Target Package TSOP, TQFP, BGA, MCP, POP, etc.
취소버튼